WoS
YÖKSİS Eşleşti
2020 Article Son Yazar
The rate of Cu doped TiO<sub>2</sub> interlayer effects on the electrical characteristics of Al/Cu:TiO<sub>2</sub>/<i>n</i>-Si (MOS) capacitors depend on frequency and voltage
MICROELECTRONICS RELIABILITY
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Cilt 106
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ISSN 0026-2714
Prof. Dr. MURAT YILDIRIM
· 3 yazar
WoS
YÖKSİS Eşleşti
2016 Meeting 1. Yazar
Temperature dependence of current-voltage characteristics of Al/rubrene/n-GaAs (100) Schottky barrier diodes
MATERIALS TODAY-PROCEEDINGS
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Cilt 3, s. 1271-1276
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ISSN 2214-7853
WoS
YÖKSİS Eşleşti
2016 Meeting 1. Yazar
Electrical Characterization of Au/Fluorene-Carbazole (FC)/p-Si Schottky Barrier Diodes
MATERIALS TODAY-PROCEEDINGS
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Cilt 3, s. 1255-1261
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ISSN 2214-7853
WoS
YÖKSİS Eşleşti
2015 Article 3. Yazar
<SUP>60</SUP>Co gamma irradiation effects on the the capacitance and conductance characteristics of Au/PMI/n-Si Schottky diodes
INDIAN JOURNAL OF PHYSICS
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Cilt 89, s. 803-810
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ISSN 0973-1458
Prof. Dr. ÖMER FARUK YÜKSEL
· 5 yazar