WoS
YÖKSİS Eşleşti
2020 Article Son Yazar
The rate of Cu doped TiO<sub>2</sub> interlayer effects on the electrical characteristics of Al/Cu:TiO<sub>2</sub>/<i>n</i>-Si (MOS) capacitors depend on frequency and voltage
MICROELECTRONICS RELIABILITY
·
Cilt 106
·
ISSN 0026-2714
Prof. Dr. MURAT YILDIRIM
· 3 yazar