Scopus Eşleşmesi Bulundu
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Atıf
34
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Özet
Metal-semiconductor (MS) heterojunctions are one of the main components of today’s technology. In the production of metal-semiconductor heterojunctions; metal oxides, insulators or polymers are inserted as interlayers between metal and semiconductor to ameliorate the durability, stability and efficiency of heterojunctions. By improving their durability, stability and efficiency through the use of ITIC as an interlayer material, the performance of these devices can be enhanced. By adding ITIC to the ZnO interlayer, ITIC: ZnO layer heterojunctions applications were carried out in this study. ITIC, a nonfullerene material, is employed as an electron acceptor material in organic solar cells. The ITIC:ZnO composite layer in our study was grown on Si substrates using spin coating method. Subsequently, Al/ZnO/p-Si and Al/ITIC:ZnO/p-Si heterojunctions were produced by physical vapor deposition method and the electrical properties of the produced devices were characterized. In these characterizations, current-voltage measurements were performed in the dark and under various light power illumination intensities ranging from 20 to 100 mW/cm2. From the current-voltage characteristics, various electrical parameters were calculated. While the ideality factor values for Al/ZnO/p-Si were found to be 7.55 and 7.73, it was found as 6.83 and 6.65 for ITIC-doped photodiode using thermionic emission and Cheung models, respectively. The barrier height values for Al/ZnO/p-Si were 0.62 eV, 0.64 eV and 0.64 eV, while the same values were found as 0.60 eV, 0.63 eV and 0.61 eV for Al/ITIC:ZnO/p-Si using the thermionic emission, Cheung and Norde models, respectively. From current transient measurements, photosensitivity, specific detectivity and responsivity were calculated as optoelectronic parameters. Moreover, the heterojunctions demonstrated high external quantum efficiency with the addition of ITIC. According to the results, ITIC component is functional for photodiode and photodetector applications.
Web of Science Eşleşmesi Bulundu
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WoS Atıf
34
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Article
Belge Türü
Kaynak: JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
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Scimago Dergi Bilgisi
Otomatik ISSN Eşleştirmesi
2023 yılı verileri
Journal of Materials Science: Materials in Electronics
Q2
SJR Quartile
0,512
SJR Skoru
106
H-Index
Kategoriler: Atomic and Molecular Physics, and Optics (Q2) · Condensed Matter Physics (Q2) · Electrical and Electronic Engineering (Q2) · Electronic, Optical and Magnetic Materials (Q2) · Bioengineering (Q3) · Biomaterials (Q3) · Biomedical Engineering (Q3) · Biophysics (Q3)
Alanlar: Biochemistry, Genetics and Molecular Biology · Chemical Engineering · Engineering · Materials Science · Physics and Astronomy
Ülke: United States
· Springer New York
Bu bilgiler makale yılına göre Scimago veritabanından ISSN eşleştirmesiyle otomatik getirilmektedir.
Dergi sıralama verileri Scimago'nun ilgili yılı baz alınmaktadır.
Anahtar Kelimeler
Bu makale için anahtar kelime bilgisi bulunmuyor.
Makale Bilgileri
Dergi
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN
0957-4522
Yıl
2023
/ 11. ay
Cilt / Sayı
34
/ 2020
Sayfalar
1 – 14
Makale Türü
Özgün Makale
Hakemlik
Hakemli
Endeks
SCI-Expanded
JCR Quartile
Q2
Teşvik Puanı
2,88
· YÖKSİS Akademik Teşvik
Yayın Dili
İngilizce
Kapsam
Uluslararası
Toplam Yazar
5 kişi
Erişim Türü
Basılı+Elektronik
Alan
Fen Bilimleri ve Matematik Temel Alanı
Kimya
Analitik Kimya
YÖKSİS Yazar Kaydı
Yazar Adı
ÖZTÜRK TEOMAN,Hussaini ALİ AKBAR,ERDAL MEHMET OKAN,DURMAZ FATİH,YILDIRIM MURAT
YÖKSİS ID
9038046